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About this Engineering article
Partial dislocations and stacking faults in 4H-SiC PiN diodes by M. E. Twigg; R. E. Stahlbush; M. Fatemi; S. D. Arthur; J. B. Fedison; J. B. Tucker; S. Wang is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- M. E. Twigg; R. E. Stahlbush; M. Fatemi; S. D. Arthur; J. B. Fedison; J. B. Tucker; S. Wang
- Publisher
- Springer US; Springer-Verlag; Springer New York LLC; Springer Science and Business Media LLC (ISSN 0361-5235)
- Published
- 2004
- Language
- EN
- Field
- Engineering (Physical Sciences)