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About this Materials Science article
Glancing incidence X-ray characterization of ultrathin YBa2Cu3O7 − x films fabricated by modulated magnetron sputtering by A. Del Vecchio; L. Tapfer; C. Camerlingo; M. Russo is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- A. Del Vecchio; L. Tapfer; C. Camerlingo; M. Russo
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0925-8388)
- Published
- 1997
- Language
- EN
- Field
- Materials Science (Physical Sciences)
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