About this Engineering article
Statistical Simulation Study of Metal Grain-Orientation-Induced MS and MIS Contact Resistivity Variability for 7-nm FinFETs by Dev, Sachin; Meena, Maneesh; Vardhan, Penugonda Harsha; Lodha, Saurabh is a Engineering article available to read on EtoBox.
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- Author
- Dev, Sachin; Meena, Maneesh; Vardhan, Penugonda Harsha; Lodha, Saurabh
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
- Published
- 2018
- Language
- EN
- Field
- Engineering (Physical Sciences)