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About this scholarly article
APEC 07 - Twenty-Second Annual IEEE Applied Power Electronics Conference and Exposition - Long-Term Stability Test System for High-Voltage, High-Frequency SiC Power Devices by Duong, Tam H.; Berning, David W.; Hefner, A. R.; Smedley, Keyue M. is a scholarly article available to read on EtoBox.
- Author
- Duong, Tam H.; Berning, David W.; Hefner, A. R.; Smedley, Keyue M.
- Publisher
- IEEE
- Published
- 2007
- Language
- EN
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