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This document discusses using an atomic force microscope (AFM) to differentiate between tracks and damages observed on the surface of solid-state nuclear track detectors (SSNTDs) after chemical etching. After etching, sponge-like structures and pits connecting in strips are observed under an optical microscope, but it is unclear if these are genuine 3D structures or just 2D images that could be confused with small particle tracks. The AFM is employed to study the tracks and damages at high resolution due to
- Author
- amyounis
- Language
- EN