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About this Engineering article
Determination of Source-and-Drain Series Resistance in 16-nm-Gate FinFET Devices by Su, Ping-Hsun; Li, Yiming is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Su, Ping-Hsun; Li, Yiming
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
- Published
- 2015
- Field
- Engineering (Physical Sciences)