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About this Physics and Astronomy article
Thin-film interdiffusions in Cu/Pd, Cu/Pt, Cu/Ni, Cu/NiB, Cu/Co, Cu/Cr, Cu/Ti, and Cu/TiN bilayer films: Correlations of sheet resistance with Rutherford backscattering spectrometries by D. Shih; C. Chang; J. Paraszczak; S. Nunes; J. Cataldo is a Physics and Astronomy article available to read on EtoBox.
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- Author
- D. Shih; C. Chang; J. Paraszczak; S. Nunes; J. Cataldo
- Publisher
- American Institute of Physics; AIP Publishing; Publons (ISSN 0021-8979)
- Published
- 1991
- Field
- Physics and Astronomy (Physical Sciences)
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