About this scholarly article

Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) - The dynamic rollback problem in concurrent event-driven fault simulation by Farinetti, L.; Montessoro, P.L. is a scholarly article available to read on EtoBox.

Author

Farinetti, L.; Montessoro, P.L.

Publisher

IEEE Comput. Soc. Press

Published

1997

Language

EN