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About this Materials Science article
Extended Depth of Field for High-Resolution Scanning Transmission Electron Microscopy by Hovden, Robert; Xin, Huolin L.; Muller, David A. is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Hovden, Robert; Xin, Huolin L.; Muller, David A.
- Publisher
- Cambridge University Press; Cambridge University Press (CUP) (ISSN 1431-9276)
- Published
- 2011
- Language
- EN
- Field
- Materials Science (Physical Sciences)
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