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About this Engineering article
Transient Thermal Analysis of Sapphire Wafers Subjected to Thermal Shocks by Vodenitcharova, T.; Zhang, L.C.; Zarudi, I.; Yin, Y.; Domyo, H.; Ho, T. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Vodenitcharova, T.; Zhang, L.C.; Zarudi, I.; Yin, Y.; Domyo, H.; Ho, T.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0894-6507)
- Published
- 2006
- Language
- EN
- Field
- Engineering (Physical Sciences)
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