About this scholarly article

SPIE Proceedings [SPIE 1988 Intl Congress on Optical Science and Engineering - Hamburg, Germany (Monday 19 September 1988)] Industrial Inspection - Optical Triangulation Using A CCD Array With Sub-Pixel Resolution by Jones, Robert; Rowbotham, Lucy; Pritchett, Michael; Braggins, Donald W. is a scholarly article available to read on EtoBox.

Author

Jones, Robert; Rowbotham, Lucy; Pritchett, Michael; Braggins, Donald W.

Publisher

SPIE

Published

1989

Language

EN