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What is Transition from STM to AFM Techniques about?

This document discusses the transition from scanning tunneling microscopy (STM) to atomic force microscopy (AFM). STM could only be used on conducting samples while many materials of interest are non-conducting. The key idea of AFM was to use the sensitivity of STM to measure the deflection of a tip mounted on a cantilever as it is rastered across an insulating substrate. This allowed topographic scans of non-conducting samples by controlling the tip-substrate force with a feedback loop. AFM has since been

Author

kishorkumarn8212

Language

EN