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About this Engineering article
Verification of minority carrier traps in Cu(In,Ga)Se2 and Cu2ZnSnSe4 by means of time-resolved photoluminescence by Maiberg, Matthias; Hölscher, Torsten; Jarzembowski, Enrico; Hartnauer, Stefan; Zahedi-Azad, Setareh; Fränzel, Wolfgang; Scheer, Roland is a Engineering article available to read on EtoBox.
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- Author
- Maiberg, Matthias; Hölscher, Torsten; Jarzembowski, Enrico; Hartnauer, Stefan; Zahedi-Azad, Setareh; Fränzel, Wolfgang; Scheer, Roland
- Publisher
- Elsevier Science; Elsevier ; Elsevier Sequoia; Elsevier BV (ISSN 0040-6090)
- Published
- 2017
- Language
- EN
- Field
- Engineering (Physical Sciences)