About this document
IC Testing and Reliability Analysis Guide by Faiz Mohd is a document available to read on EtoBox.
The document discusses integrated circuit (IC) testing, reliability, and failure analysis. It covers topics such as IC testing equipment and procedures, including wafer testing and final product testing. It also discusses reliability prediction techniques like Failure Mode and Effects Analysis (FMEA) and the bathtub curve model of failure rates over time. The bathtub curve model consists of an infant mortality period with decreasing failure rates, a normal life period with low and constant failure rates, an
- Author
- Faiz Mohd
- Language
- EN