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About this Engineering article
Analysis of Defect-Related Localized Emission Processes in InGaN/GaN-Based LEDs by Meneghini, M.; Vaccari, S.; Trivellin, N.; Dandan Zhu; Humphreys, C.; Butendheich, R.; Leirer, C.; Hahn, B.; Meneghesso, G.; Zanoni, E. is a Engineering article available to read on EtoBox.
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- Author
- Meneghini, M.; Vaccari, S.; Trivellin, N.; Dandan Zhu; Humphreys, C.; Butendheich, R.; Leirer, C.; Hahn, B.; Meneghesso, G.; Zanoni, E.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
- Published
- 2012
- Field
- Engineering (Physical Sciences)