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About this Materials Science article
Strain Characterization of Advanced CMOS Transistors: An Industry Perspective by Zhang, Jiong; Weng, Xiaojun; Yuan, Renliang; Pan, Ling; Li, Han; Kuhn, Markus; Johnson, Kevin; Zuo, Jian-Min; Ma, Zhiyong is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Zhang, Jiong; Weng, Xiaojun; Yuan, Renliang; Pan, Ling; Li, Han; Kuhn, Markus; Johnson, Kevin; Zuo, Jian-Min; Ma, Zhiyong
- Publisher
- Cambridge University Press; Cambridge University Press (CUP) (ISSN 1431-9276)
- Published
- 2018
- Field
- Materials Science (Physical Sciences)