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About this Engineering article
Topography and Refractometry of Nanostructures Using Spatial Light Interference Microscopy by Wang, Zhuo; Chun, Ik Su; Li, Xiuling; Ong, Zhun-Yong; Pop, Eric; Millet, Larry; Gillette, Martha; Popescu, Gabriel is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Wang, Zhuo; Chun, Ik Su; Li, Xiuling; Ong, Zhun-Yong; Pop, Eric; Millet, Larry; Gillette, Martha; Popescu, Gabriel
- Publisher
- Optical Society of America; The Optical Society (ISSN 0146-9592)
- Published
- 2010
- Language
- EN
- Field
- Engineering (Physical Sciences)