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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Applications of Digital Image Processing XXII - Contrasted statistical processing algorithm for obtaining improved target detection performances in an IR cluttered environment by Zalevsky, Zeev; Mendlovic, David; Rivlin, Ehud; Rotman, Stanley R.; Tescher, Andrew G. is a scholarly article available to read on EtoBox.

Author
Zalevsky, Zeev; Mendlovic, David; Rivlin, Ehud; Rotman, Stanley R.; Tescher, Andrew G.
Publisher
SPIE
Published
1999
Language
EN

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