About this scholarly article

SPIE Proceedings [SPIE Electronic Imaging 2004 - San Jose, CA (Sunday 18 January 2004)] Machine Vision Applications in Industrial Inspection XII - Machine vision system for surface inspection on brushed industrial parts by Bonnot, Nicolas; Seulin, Ralph; Merienne, Frederic; Price, Jeffery R.; Meriaudeau, Fabrice is a scholarly article available to read on EtoBox.

Author

Bonnot, Nicolas; Seulin, Ralph; Merienne, Frederic; Price, Jeffery R.; Meriaudeau, Fabrice

Publisher

SPIE

Published

2004

Language

EN