About this Materials Science article
The Influence of Beam Broadening on the Spatial Resolution of Annular Dark Field Scanning Transmission Electron Microscopy by de Jonge, Niels; Verch, Andreas; Demers, Hendrix is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- de Jonge, Niels; Verch, Andreas; Demers, Hendrix
- Publisher
- Cambridge University Press; Cambridge University Press (CUP) (ISSN 1431-9276)
- Published
- 2018
- Field
- Materials Science (Physical Sciences)