About this scholarly article

International Technical Digest on Electron Devices Meeting - Hot-carrier effects in 0.1 mu m gate length CMOS devices by Mizuno, ; Toriumi, ; Iwase, ; Takahashi, ; Niiyama, ; Fukmoto, ; Yoshimi, is a scholarly article available to read on EtoBox.

Author

Mizuno, ; Toriumi, ; Iwase, ; Takahashi, ; Niiyama, ; Fukmoto, ; Yoshimi,

Publisher

IEEE

Published

1992

Language

EN