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About this Engineering article
Depth profiles of the majority carrier concentration and the minority carrier effective lifetime in gettered GaAs by V. F. Andrievskii; A. T. Gorelenok; N. A. Zagorel’skaya; A. V. Kamanin; N. M. Shmidt is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- V. F. Andrievskii; A. T. Gorelenok; N. A. Zagorel’skaya; A. V. Kamanin; N. M. Shmidt
- Publisher
- SP MAIK Nauka/Interperiodica; Pleiades Publishing; Pleiades Publishing Ltd (ISSN 1063-7850)
- Published
- 2001
- Field
- Engineering (Physical Sciences)