About this scholarly article

2013 IEEE 8th Nanotechnology Materials and Devices Conference (NMDC) - Comparative study of process variations in junctionless and conventional double-gate MOSFETs by Chen, Chun-Yu; Lin, Jyi-Tsong; Chiang, Meng-Hsueh is a scholarly article available to read on EtoBox.

Author

Chen, Chun-Yu; Lin, Jyi-Tsong; Chiang, Meng-Hsueh

Publisher

IEEE

Published

2013