About this Engineering article
Terahertz Continuous Wave System Using Phase Shift Interferometry for Measuring the Thickness of Sub-100-μm-thick Samples Without Frequency Sweep by Choi, Da-Hye ;Lee, Il-Min ;Moon, Kiwon ;Park, Dong Woo ;Lee, Eui Su ;Park, Kyung Hyun is a Engineering article available to read on EtoBox.
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- Author
- Choi, Da-Hye ;Lee, Il-Min ;Moon, Kiwon ;Park, Dong Woo ;Lee, Eui Su ;Park, Kyung Hyun
- Publisher
- The Optical Society
- Published
- 2019
- Field
- Engineering (Physical Sciences)