About this scholarly article

2016 IEEE Electrical Insulation Conference (EIC) - A new accelerated thermal aging test for over-loading condition transformer by Sun, Weidong; Yang, Lijun; Feng, Dawei; Zhao, Xuetong; Li, Jinzhong is a scholarly article available to read on EtoBox.

Author

Sun, Weidong; Yang, Lijun; Feng, Dawei; Zhao, Xuetong; Li, Jinzhong

Publisher

IEEE

Published

2016

Language

EN