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About this Engineering article
Microstructural characterization of radio frequency magnetron sputter-deposited Ga[sub 2]O[sub 3]:Mn phosphor thin films by Kim, Joo Han; Holloway, Paul H. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Kim, Joo Han; Holloway, Paul H.
- Publisher
- AVS (American Vacuum Society); American Vacuum Society; American Institute of Physics (ISSN 0734-2101)
- Published
- 2002
- Language
- EN
- Field
- Engineering (Physical Sciences)