About this scholarly article

2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) - Angular effects in proton-induced single-event upsets in silicon-on-sapphire and silicon-on-insulator devices by Kniffin, S.D.; McCabe, J.F.; Gardner, G.A.; Lintz, J.; Ross, C.; Golke, K.; Bums, B.; Sanders, A.B.; Reed, R.A.; LaBel, K.A.; Marshall, P.W.; Liu, S.T.; Kim, H.S.; Forney, J.D.; Tabbert, C.J.; Carts, M.A.; Swonger, J.W. is a scholarly article available to read on EtoBox.

Author

Kniffin, S.D.; McCabe, J.F.; Gardner, G.A.; Lintz, J.; Ross, C.; Golke, K.; Bums, B.; Sanders, A.B.; Reed, R.A.; LaBel, K.A.; Marshall, P.W.; Liu, S.T.; Kim, H.S.; Forney, J.D.; Tabbert, C.J.; Carts, M.A.; Swonger, J.W.

Publisher

IEEE

Published

2004