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DFT Techniques for Mixed Signal Designs by Damodar Prasad Sharma is a document available to read on EtoBox.

What is DFT Techniques for Mixed Signal Designs about?

This document describes a DFT architecture using scan compression to test a mixed-signal chip with fragmented digital blocks. The architecture uses 4 external scan chains compressing to 32 internal chains allocated to the different blocks. Techniques like empty boxes and equivalent faults are used to ensure accurate test coverage reporting given the non-digital portions of the design. The architecture aims to provide robust testability even if some blocks are non-functional or partially working.

Author

Damodar Prasad Sharma

Language

EN