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About this Materials Science article
Profile agreement indices in Rietveld and pattern-fitting analysis by Hill, Roderick J. (author);Fischer, Reinhard X. (author) is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Hill, Roderick J. (author);Fischer, Reinhard X. (author)
- Publisher
- International Union of Crystallography; Blackwell Publishing Inc.; International Union of Crystallography (IUCr) (ISSN 0021-8898)
- Published
- 1990
- Field
- Materials Science (Physical Sciences)