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Comparative Study of Uniform Versus Supersteep Retrograde MOSFET Channel Doping and Implications for 6-T SRAM Yield by Damrongplasit, Nattapol; Xu, Nuo; Takeuchi, Hideki; Stephenson, Robert J.; Cody, Nyles W.; Yiptong, Augustin; Huang, Xiangyang; Hytha, Marek; Mears, Robert J.; Liu, Tsu-Jae King is a Engineering article available to read on EtoBox.

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Author
Damrongplasit, Nattapol; Xu, Nuo; Takeuchi, Hideki; Stephenson, Robert J.; Cody, Nyles W.; Yiptong, Augustin; Huang, Xiangyang; Hytha, Marek; Mears, Robert J.; Liu, Tsu-Jae King
Publisher
IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
Published
2013
Language
EN
Field
Engineering (Physical Sciences)

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Browse all works by Damrongplasit, Nattapol; Xu, Nuo; Takeuchi, Hideki; Stephenson, Robert J.; Cody, Nyles W.; Yiptong, Augustin; Huang, Xiangyang; Hytha, Marek; Mears, Robert J.; Liu, Tsu-Jae King