About this Engineering article
Study on Effect of Back Oxide Thickness Variation in FDSOI MOSFET on Analog Circuit Performance by Roy, Swarnil; Sarkar, Chandan; Mukherjee, Sagar; Dutta, Arka is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Roy, Swarnil; Sarkar, Chandan; Mukherjee, Sagar; Dutta, Arka
- Publisher
- Institution of Engineering and Technology
- Published
- 2016
- Language
- EN
- Field
- Engineering (Physical Sciences)