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About this Materials Science article
Reducing Planar Defects in 3C–SiC by H. Nagasawa; K. Yagi; T. Kawahara; N. Hatta is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- H. Nagasawa; K. Yagi; T. Kawahara; N. Hatta
- Publisher
- John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Ltd.; Wiley (ISSN 0948-1907)
- Published
- 2006
- Language
- EN
- Field
- Materials Science (Physical Sciences)
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