About this scholarly article

SPIE Proceedings [SPIE Scanning Microscopy 2010 - Monterey, California (Monday 17 May 2010)] Scanning Microscopy 2010 - The influence of surface chemistry on GSR particles: using XPS to complement SEM/EDS analytical techniques by Postek, Michael T.; Schwoeble, A. J.; Strohmeier, Brian R.; Newbury, Dale E.; Platek, S. Frank; Piasecki, John D.; Joy, David C. is a scholarly article available to read on EtoBox.

Author

Postek, Michael T.; Schwoeble, A. J.; Strohmeier, Brian R.; Newbury, Dale E.; Platek, S. Frank; Piasecki, John D.; Joy, David C.

Publisher

SPIE

Published

2010

Language

EN