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About this Engineering article
Employing Thin Film Failure Mechanisms to Form Templates for Nano-electronics by Adelung, Rainer ;Elbahri, Mady ;Rudra, Shiva Kumar ;Biswas, Abhijit ;Jebril, Seid ;Kunz, Rainer ;Wille, Sebastian ;Scharnberg, Michael is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Adelung, Rainer ;Elbahri, Mady ;Rudra, Shiva Kumar ;Biswas, Abhijit ;Jebril, Seid ;Kunz, Rainer ;Wille, Sebastian ;Scharnberg, Michael
- Publisher
- Cambridge University Press; Cambridge University Press (Materials Research Society); Cambridge University Press (CUP) (ISSN 0272-9172)
- Published
- 2005
- Field
- Engineering (Physical Sciences)