About this scholarly article

SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 7 April 2008)] Optical Micro- and Nanometrology in Microsystems Technology II - A multipoint diffraction strain sensor using a micro-lens array: from theory to application by Wang, Jun; Asundi, Anand; Gorecki, Christophe; Asundi, Anand K.; Osten, Wolfgang is a scholarly article available to read on EtoBox.

Author

Wang, Jun; Asundi, Anand; Gorecki, Christophe; Asundi, Anand K.; Osten, Wolfgang

Publisher

SPIE

Published

2008

Language

EN