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2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) - Current total ionizing dose results and displacement damage results for candidate spacecraft electronics for NASA by Cochran, D.J.; Buchner, S.P.; Irwin, T.L.; Kniffin, S.D.; Ladbury, R.L.; Palor, C.D.; LaBel, K.A.; Marshall, C.J.; Reed, R.A.; Sanders, A.B.; Hawkins, D.K.; Flanigan, R.J.; Cox, S.R.; O'Bryan, M.V.; Carts, M.A.; Poivey, C.F.; Howard, J.W.; Kim, H.S.; Forney, J.D.; Marshall, P.W. is a scholarly article available to read on EtoBox.

Author
Cochran, D.J.; Buchner, S.P.; Irwin, T.L.; Kniffin, S.D.; Ladbury, R.L.; Palor, C.D.; LaBel, K.A.; Marshall, C.J.; Reed, R.A.; Sanders, A.B.; Hawkins, D.K.; Flanigan, R.J.; Cox, S.R.; O'Bryan, M.V.; Carts, M.A.; Poivey, C.F.; Howard, J.W.; Kim, H.S.; Forney, J.D.; Marshall, P.W.
Publisher
IEEE
Published
2004
Language
EN

More by Cochran, D.J.; Buchner, S.P.; Irwin, T.L.; Kniffin, S.D.; Ladbury, R.L.; Palor, C.D.; LaBel, K.A.; Marshall, C.J.; Reed, R.A.; Sanders, A.B.; Hawkins, D.K.; Flanigan, R.J.; Cox, S.R.; O'Bryan, M.V.; Carts, M.A.; Poivey, C.F.; Howard, J.W.; Kim, H.S.; Forney, J.D.; Marshall, P.W.

Browse all works by Cochran, D.J.; Buchner, S.P.; Irwin, T.L.; Kniffin, S.D.; Ladbury, R.L.; Palor, C.D.; LaBel, K.A.; Marshall, C.J.; Reed, R.A.; Sanders, A.B.; Hawkins, D.K.; Flanigan, R.J.; Cox, S.R.; O'Bryan, M.V.; Carts, M.A.; Poivey, C.F.; Howard, J.W.; Kim, H.S.; Forney, J.D.; Marshall, P.W.