Opening book details…
About this Engineering article
Measurement of the Roughness of Nano-scale Surfaces, Both Unannealed and with Limited Anneal, by Atomic Force Microscopy by Seah, M P is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Seah, M P
- Publisher
- Institute of Physics; IOP Publishing; Institute of Physics and the Physical Society (ISSN 0957-0233)
- Published
- 2014
- Language
- EN
- Field
- Engineering (Physical Sciences)