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About this Computer Science article
High-speed inline defect detection for TFT-LCD array process using a novel support vector data description by Yi-Hung Liu; Yan-Chen Liu; Yen-Zen Chen is a Computer Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Computer Science.
- Author
- Yi-Hung Liu; Yan-Chen Liu; Yen-Zen Chen
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd.; Elsevier BV (ISSN 0957-4174)
- Published
- 2011
- Language
- EN
- Field
- Computer Science (Physical Sciences)