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2013 IEEE Electric Ship Technologies Symposium (ESTS) - The impact of power quality when high power pulsed DC and continuous AC loads are simultaneously operated on a MicroGrid testbed by Kelley, J. P.; Wetz, D. A.; Reed, J. A.; Cohen, I. J.; Turner, G. K.; Lee, W. is a scholarly article available to read on EtoBox.

Author
Kelley, J. P.; Wetz, D. A.; Reed, J. A.; Cohen, I. J.; Turner, G. K.; Lee, W.
Publisher
IEEE
Published
2013