About this scholarly article

Proceedings of the 43rd annual conference on Design automation - DAC '06 - Variability driven gate sizing for binning yield optimization by Davoodi, Azadeh; Srivastava, Ankur is a scholarly article available to read on EtoBox.

Author

Davoodi, Azadeh; Srivastava, Ankur

Publisher

ACM Press

Published

2006