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About this Engineering article
X-ray Photoelectron Spectroscopy (XPS) Depth Profiling for Evaluation of La2Zr2O7 Buffer Layer Capacity by Narayanan, Vyshnavi; de Buysser, Klaartje; Bruneel, Els; Driessche, Isabel van is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Narayanan, Vyshnavi; de Buysser, Klaartje; Bruneel, Els; Driessche, Isabel van
- Publisher
- MDPI AG; MDPI Open Access Publishing; Basel: MDPI, 2008-; Publons (ISSN 1996-1944)
- Published
- 2012
- Field
- Engineering (Physical Sciences)
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