About this scholarly article

SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Application of the laser scanning confocal microscope in fluorescent film sensor research by Zhang, Hongyan; Zhang, Yudong; Sasián, José; Liu, Wei-Min; Zhao, Wen-Wen; Xiang, Libin; To, Sandy; Dai, Qing; Wang, Peng-Fei is a scholarly article available to read on EtoBox.

Author

Zhang, Hongyan; Zhang, Yudong; Sasián, José; Liu, Wei-Min; Zhao, Wen-Wen; Xiang, Libin; To, Sandy; Dai, Qing; Wang, Peng-Fei

Publisher

SPIE

Published

2010

Language

EN