About this scholarly article

AIP Conference Proceedings [AIP Publishing LLC ADVANCED MATERIALS AND RADIATION PHYSICS (AMRP-2015): 4th National Conference on Advanced Materials and Radiation Physics - Longowal, India (13–14 March 2015)] - Trace elemental analysis of school chalk using energy dispersive X-ray florescence spectroscopy (ED-XRF) by Maruthi, Y. A.; Das, N. Lakshmana; Ramprasad, S.; Ram, S. S.; Sudarshan, M. is a scholarly article available to read on EtoBox.

Author

Maruthi, Y. A.; Das, N. Lakshmana; Ramprasad, S.; Ram, S. S.; Sudarshan, M.

Publisher

AIP Publishing LLC

Published

2015