About this scholarly article

2009 4th International Design and Test Workshop (IDT) - Modeling of gate oxide short defects in MOSFETS by Chehade, Sarah; Chehab, Ali; Kayssi, Ayman is a scholarly article available to read on EtoBox.

Author

Chehade, Sarah; Chehab, Ali; Kayssi, Ayman

Publisher

IEEE

Published

2009