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About this scholarly article
2016 IEEE International Electron Devices Meeting (IEDM) - 32-bit Processor core at 5-nm technology: Analysis of transistor and interconnect impact on VLSI system performance by Lee, Chi-Shuen; Cline, Brian; Sinha, Saurabh; Yeric, Greg; Wong, H.-S. Philip is a scholarly article available to read on EtoBox.
- Author
- Lee, Chi-Shuen; Cline, Brian; Sinha, Saurabh; Yeric, Greg; Wong, H.-S. Philip
- Publisher
- IEEE
- Published
- 2016
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