About this scholarly article

SPIE Proceedings [SPIE Defense and Security Symposium - Orlando (Kissimmee), FL (Monday 17 April 2006)] Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI - Fast line-of-sight imagery for target and exhaust-plume signatures (FLITES) scene generation program by Crow, Dennis; Murrer, Jr., Robert Lee; Coker, Charles; Keen, Wayne is a scholarly article available to read on EtoBox.

Author

Crow, Dennis; Murrer, Jr., Robert Lee; Coker, Charles; Keen, Wayne

Publisher

SPIE

Published

2006