About this scholarly article

12th Annual Symposium on Gallium Arsenide Integrated Circuit (GaAs IC) - Reliability analysis of GaAs/AlGaAs HBTs under forward current/temperature stress by Hafizi, M.E.; Pawlowicz, L.M.; Tran, L.T.; Umemoto, D.K.; Streit, D.C.; Oki, A.K.; Kim, M.E.; Yen, K.H. is a scholarly article available to read on EtoBox.

Author

Hafizi, M.E.; Pawlowicz, L.M.; Tran, L.T.; Umemoto, D.K.; Streit, D.C.; Oki, A.K.; Kim, M.E.; Yen, K.H.

Publisher

IEEE

Published

1990