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About this scholarly article
2013 IEEE Radiation Effects Data Workshop (REDW) - TID Test Results for 4th Generation iPadTM by Guertin, S. M.; Allen, G. R.; McClure, S. S.; LaBel, K. A. is a scholarly article available to read on EtoBox.
- Author
- Guertin, S. M.; Allen, G. R.; McClure, S. S.; LaBel, K. A.
- Publisher
- IEEE
- Published
- 2013
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