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IEEE International Integrated Reliability Workshop Final Report, 2002. - Thermal and dielectric breakdown for metal insulator metal capacitors (MIMCAP) with tantalum pentoxide dielectric by Allers, K.-H.; Schwab, R.; Walter, W.; Schrenk, M.; Korner, H. is a scholarly article available to read on EtoBox.
- Author
- Allers, K.-H.; Schwab, R.; Walter, W.; Schrenk, M.; Korner, H.
- Publisher
- IEEE
- Published
- 2002
- Language
- EN
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