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What is Phase Contrast STEM For Thin Samples. Integrated Differential Phase Contrast about?

This document discusses the integrated differential phase contrast (iDPC) technique in scanning transmission electron microscopy (STEM), which allows for imaging thin samples by analyzing the movement of the center of mass (COM) of electron diffraction patterns. The authors derive contrast transfer functions for both iDPC and integrated COM (iCOM) techniques, demonstrating their linear relationship to the phase shift and local electrostatic potential of the sample. Experimental results validate the effectiv

Author

Javier Acuña

Language

EN